FPGA Testing

Due to their inherent flexibility and fast time to market, the usage of FPGAs has been growing steadily in recent years. Developments like 3D and 14nm process technology are opening up new opportunities for FPGAs in applications such as medical imaging, telecommunications, consumer electronics and high-performance computing. As these programmable devices assume more demanding roles, the testing requirements are becoming more demanding as well.

STS has long been considered to be a trusted, reliable provider of FPGA testing services for the military and aerospace markets. Our history of working to the most stringent standards make STS the perfect FPGA test provider for a wide range of commercial applications. No matter how complex the device, our in-house testing experts can develop a comprehensive test program to ensure the most accurate assessment of FPGA reliability. STS can quickly process even large orders using our high-speed, ultra-high-power automatic testing equipment (ATE), which can accommodate features sizes as low as 28nm.

The secret to our success in the FPGA testing field is the STS hammer file, a proprietary test methodology based on our experience testing thousands of unique FPGA designs. The hammer file is designed to program the FPGA to its maximum combination and block configuration and then tests the completely programmed FPGA for full dynamic, DC and at-speed AC performance. Power and transient tests are also conducted under worst-case populated configurations. Application-specific usage configurations are also used to assist in generating the worst-case electrical specification limits at worst-case environmental use.

The STS Advantage

  • Proven track record with aerospace, military and commercial customers
  • Custom test program development from your electrical requirements
  • STS-proprietary technology tests:
    • Full dynamic, DC and at-speed AC performance
    • Power and transients
    • Application-specific usage
    • Worst-case environmental conditions
  • Features sizes: 28, 32, 45 and 90 nanometer
  • High-speed and ultra-high-power ATEs
  • Full dynamic, DC, and at-speed AC testing

Industries

  • Aerospace and defense
  • Industrial
  • Communications
  • Networking
  • Medical

Typical Applications

  • Custom system on a chip (SoC)
  • Signal processing systems
  • Image processing systems
  • CPU accelerators
  • ASIC emulation and verification

Equipment

Test Handlers
  • Epson NS-8040 IC Handler (2)
  • Synax SC3100 quad site test handlers (2)
  • Synax SC1211 dual site test handlers (2)
Mixed Signal Testers
  • LTX-Credence Fusion CX
Digital Testers
  • Verigy V93000
  • LTX-Credence D10
  • LTX-Credence ASL 100
  • LTX-Credence Valstar 2000
  • LTX-Credence Quartet
  • LTX-Credence SC312/SC2123