Electrical Testing

Electrical testing for reliability identifies devices that are susceptible to failure from electrical stress mechanisms such as electrostatic discharge, high electro-magnetic fields, latch-up, overvoltage and overcurrent.

Building on decades of experience of qualifying devices to rigorous military and aerospace/defense specifications, Micross STS has developed an extensive capability for electrical reliability testing. Our process consists of a carefully engineered sequence of curve tracing, micro and pico-probing, resistance and capacitance measurements and oscillator frequency measurements to screen out substandard or weakened components.

The Micross STS Advantage

  • Proven track record in demanding military, aerospace/defense and commercial applications
  • Advanced ESD & latch-up testers up to 2304 Pins
  • Multi-trace pin counts up to 625 with expandability
  • Support for wide range of package types (DIP, PLCC, BGA, PGA, QFP, QFN, SOIC, CTAB)

Typical Applications

  • Microprocessors
  • CPUs, SIPs and SOCs
  • High-speed memories and data converters
  • RF devices

Equipment

  • Multi-trace testers
  • Semiconductor parameter analyzer
  • LCR meter
  • Oscilloscopes
  • Curve tracers
  • Multimeters and picoammeters
  • Power supplies and signal generators
  • Environmental chambers, hot chucks and heat forcing equipment
  • Probing stations
  • Pico-probes™