High-Speed Digital Testing

High-speed devices create significant challenges for functional testing, for example, the need for high-bandwidth interfacing to maintain signal integrity at multi-gigabits per second data rates and the ability to measure high-speed bit error rate and jitter. STS brings extensive experience in high-speed functional testing for commercial, military and aerospace devices to meet the most stringent customer requirements. Our highly integrated testing laboratory and efficient workflow are designed with one goal in mind: to shorten time-to-market and enhance our customers’ ability to compete.

The STS Advantage

  • More than four decades of experience serving commercial, military, and aerospace markets
  • In-house competency in test program development for all major memory technologies as well as high-speed data converters and logic families


  • Aerospace and defense
  • Industrial
  • Communications
  • Networking
  • Medical

Typical Applications

  • High-speed memories:
    • Flash, EEPROM, EPROM, Serial
  • High-speed data converters
  • All major logic families

RAD Testing


Test Handlers
  • Epson NS-8040 IC Handler (2)
  • Synax SC3100 quad site test handlers (2)
  • Synax SC1211 dual site test handlers (2)
Wafer Probers
  • Accretech UF3000EX
  • Accretech UF200
Digital Testers
  • Verigy V93000
  • LTX-Credence D10
  • LTX-Credence ASL 100
  • LTX-Credence Valstar 2000
  • LTX-Credence Quartet
  • LTX-Credence SC312/SC2123
Mixed Signal Testers
  • LTX-Credence Fusion CX

View our complete ATE equipment list or email STS for more information.